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Japanese Scholars Visit SIST Proposing Collaboration

  • 系统管理员
  • 2011-06-03
  • 21

Two Japanese Scholars, Prof. Hiroshi Ochi from Kyushu Institute of Technology (KIT) and Dr. Baiko Sai from ROHM Company, paid a short visit to School of Information Science and Technology (SIST) from June 2nd to 5th. On June 3rd, a welcome meeting was hosted by Prof. LI Weiping, Dean of the School, at the meeting room of SIST, and Dean LIN Fujiang from Dept. of Electronic Science and Technology with other professors also showed their presence at the meeting.

 

 

After a brief introduction to the work units of both sides, Dr. Sai suggested that ROHM Company is willing to cooperate with several domestic universities for a purpose of fundamental research and market-oriented application. He also gave a highly appraise to the laboratories they visited the day before, and expressed the willingness to bring the Head of ROHM to USTC for a further visit. Prof. Ochi assumed that if his study could combine with SIST’s forte in RF area, the outcome might turn out to be a promising profit. SIST side showed big interest in cooperating with ROHM and KIT, and the two sides exchanged views on the way and research field of collaboration. Hopefully, chances for teachers and students to visit Japanese Companies and Universities might be realized in the near future.

 

 

The two Japanese scholars also gave academic reports separately to the graduate students from Dept. of Electronic Science and Technology earlier in the morning.


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